---
id: 9994
title: "Enhancing Semiconductor Security with Pre-Silicon Testing"
source_domain: eshard.com
source_url: "https://www.eshard.com/blog/pre-silicon-testing-semiconductor"
published_at: "2024-09-08T00:00:00Z"
tags: ["vulnerability-research", "hardware-security", "side-channel"]
phying_url: "https://phying.com/item/9994"
lang: en
---

# Enhancing Semiconductor Security with Pre-Silicon Testing

## Summary

Shift left for hardware security. Discover how the Ansys and eShard collaboration enables pre-silicon side-channel testing, helping manufacturers catch power and EM vulnerabilities before production to save millions in redesign costs.

## Intelligence Metadata

- **Sources:** eshard.com
- **Published:** 2024-09-08T00:00:00Z
- **Original:** https://www.eshard.com/blog/pre-silicon-testing-semiconductor
- **Phying News:** https://phying.com/item/9994